IC Test Socket QFP/BGA

Yamaichi Electronics·IC51-1004-399

Description

Yamaichi high-reliability IC test and burn-in sockets for QFP, BGA, and QFN packages. Up to 50,000 insertions. Kelvin-connected versions for 4-wire resistance measurement. Used in automotive IC qualification testing, AEC-Q100 burn-in, and semiconductor ATE systems.

Technical Specifications

Pin/Contact Count
32–1156
Rated Voltage
50V
IP Rating
IP20
Temperature Range
-55 to +155°C
Shell Material
LCP/PEEK
Mating Cycles
50,000 cycles
IP RatingIP20
IP20IP40IP54IP65IP68

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